DocumentCode
1155272
Title
Planar AlGaAs/GaAs HBT fabricated by MOCVD overgrowth with a grown base
Author
Plumton, Donald L. ; Yang, Jau-Yuann ; Morris, F.J. ; Lambert, Steven A.
Author_Institution
Texas Instrum., Dallas, TX, USA
Volume
37
Issue
5
fYear
1990
fDate
5/1/1990 12:00:00 AM
Firstpage
1187
Lastpage
1192
Abstract
A planar heterojunction bipolar transistor (HBT) with an AlGaAs emitter layer epitaxially grown onto a selectively defined grown base layer, where the base is grown with the collector as part of the original epi, is discussed. The transistors fabricated with this process exhibit good gain and output characteristics. Transistors with 7×7 μm2 emitters have exhibited a DC current gain of 10 to 1000 for base doping from 1×1019 to 8×1017 cm3, respectively, and Early voltages ⩾100 V. The propagation delay of 19-stage ring oscillators was 87 ps/gate. The transistor-fabrication process was designed to be manufacturable, and the planar nature of the transistor surface should permit large-scale integration with good yields
Keywords
III-V semiconductors; aluminium compounds; bipolar integrated circuits; gallium arsenide; heterojunction bipolar transistors; semiconductor growth; vapour phase epitaxial growth; 100 V; 19-stage ring oscillators; AlGaAs-GaAs; DC current gain; Early voltages; HBT; MOCVD overgrowth; base doping; epitaxial growth; gain; large-scale integration; output characteristics; planar heterojunction bipolar transistor; propagation delay; selectively defined grown base layer; Doping; Gallium arsenide; Heterojunction bipolar transistors; Large scale integration; MOCVD; Manufacturing processes; Process design; Propagation delay; Ring oscillators; Voltage-controlled oscillators;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/16.108178
Filename
108178
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