DocumentCode
11560
Title
Whitening SOA Testing via Event Exposure
Author
Chunyang Ye ; Jacobsen, Hans-Arno
Author_Institution
Dept. of Electr. & Comput. Eng., Univ. of Toronto, Toronto, ON, Canada
Volume
39
Issue
10
fYear
2013
fDate
Oct. 2013
Firstpage
1444
Lastpage
1465
Abstract
Whitening the testing of service-oriented applications can provide service consumers confidence on how well an application has been tested. However, to protect business interests of service providers and to prevent information leakage, the implementation details of services are usually invisible to service consumers. This makes it challenging to determine the test coverage of a service composition as a whole and design test cases effectively. To address this problem, we propose an approach to whiten the testing of service compositions based on events exposed by services. By deriving event interfaces to explore only necessary test coverage information from service implementations, our approach allows service consumers to determine test coverage based on selected events exposed by services at runtime without releasing the service implementation details. We also develop an approach to design test cases effectively based on event interfaces concerning both effectiveness and information leakage. The experimental results show that our approach outperforms existing testing approaches for service compositions with up to 49 percent more test coverage and an up to 24 percent higher fault-detection rate. Moreover, our solution can trade off effectiveness, efficiency, and information leakage for test case generation.
Keywords
Web services; program testing; service-oriented architecture; SOA testing whitening; Web services; event exposure; fault-detection rate; information leakage; service composition; service consumers; service providers; service-oriented architecture; test case design approach; test case generation; test coverage; Books; Catalogs; Jacobian matrices; Runtime; Service-oriented architecture; Testing; Web service composition; event interface; events; white-box testing;
fLanguage
English
Journal_Title
Software Engineering, IEEE Transactions on
Publisher
ieee
ISSN
0098-5589
Type
jour
DOI
10.1109/TSE.2013.20
Filename
6495456
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