• DocumentCode
    115726
  • Title

    Technological frontiers and embeddings: A visualization approach

  • Author

    Cunningham, Scott W. ; Kwakkel, Jan H.

  • Author_Institution
    Fac. of Technol., Policy & Manage., Delft Univ. of Technol., Delft, Netherlands
  • fYear
    2014
  • fDate
    27-31 July 2014
  • Firstpage
    2891
  • Lastpage
    2902
  • Abstract
    The paper concerns the measurement and forecasting of technological change, a topic relevant to many high-tech organizations and their customers. We revisit recent and classic data sets from technology forecasting data envelopment analysis (TFDEA) research and technometrics in light of a new visualization technique known as t-Distributed Stochastic Neighbor Embedding (t-SNE). The technique is a non-linear visualization technique for preserving local structure in high-dimensional spaces of data. The technique may be classified as a form of topological data analysis. Specifically each point in the space represents a potential technological design or implementation, and each line segment in the space represents a local measure of technological improvement or degradation. We hypothesize six distinct kinds of performance development in technology within this space including the frontier, the fold, the salient, the soliton, and the lock-in. Then we examine the spaces to determine which kinds of development are the best explanations for observed development. The technique is not extrapolative, and therefore cannot supplant existing technometric methods. Nonetheless the approach offers a useful diagnostic to existing technometric methods, and may help advance theories of technological development.
  • Keywords
    data analysis; data envelopment analysis; innovation management; stochastic processes; technological forecasting; technology management; technology transfer; TFDEA; high-dimensional spaces; high-tech organizations; non-linear visualization technique; t-SNE; t-distributed stochastic neighbor embedding; technological change forecasting; technological change measurement; technological degradation; technological embeddings; technological frontiers; technological improvement; technology forecasting data envelopment analysis; technometric methods; topological data analysis; visualization approach; Biological system modeling; Data models; Data visualization; Economics; Educational institutions; Manifolds; Organizations;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Management of Engineering & Technology (PICMET), 2014 Portland International Conference on
  • Conference_Location
    Kanazawa
  • Type

    conf

  • Filename
    6921252