• DocumentCode
    1157263
  • Title

    A CMOS Current-Mode Active Pixel Sensor for High Energy Physics and Biomedical Imaging Applications

  • Author

    Heini, Sbastien ; Himmi, Abdelkader ; Hu-Guo, Christine ; Winter, Marc ; Hu, Yann ; Tang, Zhenan

  • Author_Institution
    Dept. de Recherches Subatomique, Inst. Pluridisciplinaire Hubert Curien, Strasbourg
  • Volume
    56
  • Issue
    1
  • fYear
    2009
  • Firstpage
    346
  • Lastpage
    353
  • Abstract
    Monolithic Active Pixel Sensors (MAPS) using standard low cost CMOS technology available from industrial manufacturers have demonstrated excellent tracking performances for minimum ionizing particles and biomedical imaging applications. The need for highly granular, fast, thin sensor drives an R&D effort, aiming to optimize the intrinsic sensor performances. Following this main issue, we present a design of PhotoFET using CMOS submicron technology in this paper. This structure integrates advantageously an amplification using PMOS transistor inside the sensing element. This provides to the sensing element a high sensitivity to ionizing particles and a large dynamic range. The proposed PhotoFET has been implemented with a standard 0.35 mum CMOS process. In this paper, the PhotoFET architecture is presented and the main measured results are shown.
  • Keywords
    CMOS image sensors; MOSFET; biomedical imaging; field effect transistors; nuclear electronics; position sensitive particle detectors; readout electronics; silicon radiation detectors; CMOS submicron technology; MAPS; PMOS transistor; PhotoFET; R and D; biomedical imaging; high energy physics; ionizing particles; monolithic active pixel sensors; readout electronics; silicon detectors; thin sensor drives; Biomedical imaging; Biosensors; CMOS image sensors; CMOS technology; Costs; Dynamic range; MOSFETs; Manufacturing industries; Particle tracking; Pixel; CMOS sensors; correlated double sampling; current mode signal processing;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.2008.2009984
  • Filename
    4782179