• DocumentCode
    1158510
  • Title

    Voltage-Aware Static Timing Analysis

  • Author

    Kouroussis, Dionysios ; Ahmadi, Rubil ; Najm, Farid N.

  • Author_Institution
    Dept. of Electr. Eng., Toronto Univ., Ont.
  • Volume
    25
  • Issue
    10
  • fYear
    2006
  • Firstpage
    2156
  • Lastpage
    2169
  • Abstract
    Static timing analysis (STA) techniques allow a designer to check the timing of a circuit at different process corners, which typically include corner values of the supply voltages as well. Traditionally, however, this analysis only considers cases where the supplies are either all low or all high. As will be demonstrated, this may not yield the true maximum delay of a circuit because it neglects the possible mismatch between the supplies of successive gates on a path. A new methodology for timing analysis is proposed, where, in a first step, the critical paths of a circuit are identified under an assumption that all the supply nodes are independent of one another, thus allowing for mismatch between the supplies. Then, given these critical paths, the authors incorporate into the analysis the relationships between the supply node voltages by considering the power grid that they are tied to, and refine the worst case time delay values on a per-critical-path basis. This refinement is posed as a sequence of optimization problems where the operation of the circuit is abstracted in terms of current constraints. The authors present their technique and report on the implementation results using benchmark circuits tied to a number of test-case power grids
  • Keywords
    integrated circuit design; logic design; power grid; rail voltage variations; static timing analysis; supply node voltages; time delays; verification tools; Benchmark testing; Circuit testing; Constraint optimization; Delay effects; Network-on-a-chip; Power grids; Power supplies; Rails; Timing; Voltage fluctuations; Power grid; rail voltage variations; static timing analysis; verification tools;
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/TCAD.2005.860953
  • Filename
    1677698