Intensity and phase statistics of multilook polarimetric and interferometric SAR imagery

Author

Lee, Jong-Sen ; Hoppel, Karl W. ; Mango, Stephen A. ; Miller, Allen R.

Author_Institution

Div. of Remote Sensing, Naval Res. Lab., Washington, DC, USA

Volume

32

Issue

5

fYear

1994

fDate

9/1/1994 12:00:00 AM

Firstpage

1017

Lastpage

1028

Abstract

Polarimetric and interferometric SAR data are frequently multilook processed for speckle reduction and data compression. The statistical characteristics of multilook data are quite different from those of single-look data. The authors investigate the statistics of their intensity and phase. Probability density function (PDF´s) of the multilook phase difference, magnitude of complex product, and intensity and amplitude ratios between two components of the scattering matrix are derived, and expressed in closed forms. The PDF´s depend on the complex correlation coefficient and the number of looks. Comparisons of these theoretically derived PDF´s are made to measurements from NASA/JPL AIRSAR data. The results of this paper can be applied to feature classification using polarimetric SAR and to the estimation of decorrelation effects of the interferometric SAR

Keywords

feature extraction; geophysical techniques; geophysics computing; image coding; image recognition; remote sensing by radar; synthetic aperture radar; complex correlation coefficient; data compression; decorrelation effects; feature classification; feature extraction; geophysical measurement technique; image classification; intensity statistics; interferometric SAR imagery; land surface imaging; multilook phase difference; multilook polarimetry; phase statistics; probability density function; radar remote sensing; scattering matrix; signal processing; speckle reduction; synthetic aperture radar; Covariance matrix; Decorrelation; Density functional theory; NASA; Phase measurement; Radar polarimetry; Radar scattering; Sea measurements; Speckle; Statistics;

fLanguage

English

Journal_Title

Geoscience and Remote Sensing, IEEE Transactions on

Publisher

ieee

ISSN

0196-2892

Type

jour

DOI

10.1109/36.312890

Filename

312890