• DocumentCode
    1159270
  • Title

    Effects of Faults and Shunt Reactor Parameters on Parallel Resonance

  • Author

    Colapret, E.E. ; Reid, W.E.

  • Author_Institution
    Tucson Gas & Electric Co.
  • Issue
    2
  • fYear
    1981
  • Firstpage
    572
  • Lastpage
    584
  • Abstract
    It is shown that more shunt reactor values may cause resonance on paralleled EHV lines than has been reported previously [1, 2, 3, 4] when faults on the opened circuit are analyzed. This is verified by approximate electrostatic calculations and detailed system calculations for various reactor and transformer configurations. The importance of evaluating reactor zero-sequence currents and secondary-arc currents, as well as the coupled voltages, is illustrated and aTNAsimulation ofparallel resonance is also included.
  • Keywords
    Circuit analysis; Circuit faults; Conductors; Coupling circuits; Electrostatics; Equations; Inductors; RLC circuits; Resonance; Shunt (electrical);
  • fLanguage
    English
  • Journal_Title
    Power Apparatus and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9510
  • Type

    jour

  • DOI
    10.1109/TPAS.1981.316914
  • Filename
    4110639