• DocumentCode
    1159798
  • Title

    Compact Modeling of Anomalous High-Frequency Behavior of MOSFET´s Small-Signal NQS Parameters in Presence of Velocity Saturation

  • Author

    Roy, Ananda S. ; Enz, Christian C. ; Sallese, Jean-Michel

  • Author_Institution
    Electron. Lab., Swiss Fed. Inst. of Technol., Lausanne
  • Volume
    53
  • Issue
    9
  • fYear
    2006
  • Firstpage
    2044
  • Lastpage
    2050
  • Abstract
    This paper presents a physical charge-based compact small-signal nonquasi-static (NQS) model for MOST, including velocity saturation and valid in all regions of inversion (from weak to strong inversion). This model intrinsically predicts the anomalous high-frequency behavior of transadmittance (ydg) in saturation, which was observed earlier in both device simulation and measurement. It also shows that the inclusion of velocity saturation causes the magnitude of the gate-to-drain admittance ydg to start to increase (instead of decreasing) above a certain frequency and its real part also starts to increase in the negative direction instead of becoming zero. In addition, even for a long channel MOST, the weak inversion charge present at the drain can also affect the ydg in a similar way
  • Keywords
    MOSFET; carrier mobility; semiconductor device models; MOSFET; anomalous high-frequency behavior; compact modeling; device measurement; device simulation; mobility degradation; small-signal nonquasi-static model; strong inversion region; velocity saturation; weak inversion region; Admittance; Bluetooth; CMOS technology; Capacitance; Degradation; Laboratories; MOSFET circuits; Predictive models; Radio frequency; Semiconductor device modeling; MOSFET compact model; Mobility degradation; nonquasi-static (NQS) effect;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2006.880226
  • Filename
    1677838