DocumentCode
1159798
Title
Compact Modeling of Anomalous High-Frequency Behavior of MOSFET´s Small-Signal NQS Parameters in Presence of Velocity Saturation
Author
Roy, Ananda S. ; Enz, Christian C. ; Sallese, Jean-Michel
Author_Institution
Electron. Lab., Swiss Fed. Inst. of Technol., Lausanne
Volume
53
Issue
9
fYear
2006
Firstpage
2044
Lastpage
2050
Abstract
This paper presents a physical charge-based compact small-signal nonquasi-static (NQS) model for MOST, including velocity saturation and valid in all regions of inversion (from weak to strong inversion). This model intrinsically predicts the anomalous high-frequency behavior of transadmittance (ydg) in saturation, which was observed earlier in both device simulation and measurement. It also shows that the inclusion of velocity saturation causes the magnitude of the gate-to-drain admittance ydg to start to increase (instead of decreasing) above a certain frequency and its real part also starts to increase in the negative direction instead of becoming zero. In addition, even for a long channel MOST, the weak inversion charge present at the drain can also affect the ydg in a similar way
Keywords
MOSFET; carrier mobility; semiconductor device models; MOSFET; anomalous high-frequency behavior; compact modeling; device measurement; device simulation; mobility degradation; small-signal nonquasi-static model; strong inversion region; velocity saturation; weak inversion region; Admittance; Bluetooth; CMOS technology; Capacitance; Degradation; Laboratories; MOSFET circuits; Predictive models; Radio frequency; Semiconductor device modeling; MOSFET compact model; Mobility degradation; nonquasi-static (NQS) effect;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/TED.2006.880226
Filename
1677838
Link To Document