• DocumentCode
    1160029
  • Title

    Performance of Low-Dark-Current 4H-SiC Avalanche Photodiodes With Thin Multiplication Layer

  • Author

    Guo, Xiangyi ; Beck, Ariane L. ; Huang, Zhihong ; Duan, Ning ; Campbell, Joe C. ; Emerson, David ; Sumakeris, Joseph J.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Texas Univ., Austin, TX
  • Volume
    53
  • Issue
    9
  • fYear
    2006
  • Firstpage
    2259
  • Lastpage
    2265
  • Abstract
    The authors report on the fabrication and performance of low-dark-current 4H-SiC avalanche photodiodes with a thin 180-nm-thick p - multiplication layer. At a photocurrent gain M of 1000, the dark current of a 100-mum-diameter device was 35 pA (0.44 muA/cm2). The peak unity-gain responsivity was 100 mA/W (external quantum efficiency=46%) at lambda=268 nm, and at high gain, a responsivity greater than 107 A/W was achieved. The excess noise factor corresponds to k=0.12. Time-domain pulse measurements indicate an RC-limited unity-gain bandwidth of 300 MHz
  • Keywords
    avalanche photodiodes; carbon compounds; photodetectors; semiconductor technology; wide band gap semiconductors; APD; SiC; avalanche photodiodes; impact ionization; low-dark-current 4H-SiC; photodetector; thin multiplication layer; time-domain pulse measurements; Avalanche photodiodes; Dark current; Fabrication; Impact ionization; Photoconductivity; Photodetectors; Photomultipliers; Silicon carbide; Temperature sensors; Tunneling; Avalanche photodiode (APD); impact ionization; photodetector; photodiode; silicon carbide;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2006.879677
  • Filename
    1677862