• DocumentCode
    1162563
  • Title

    Substrate coupling in a high-gain 30-Gb/s SiGe amplifier-modeling, suppression, and measurement

  • Author

    Steiner, Wolfgang ; Rein, Hans-Martin ; Berntgen, Jürgen

  • Author_Institution
    Ruhr-Univ. Bochum, Germany
  • Volume
    40
  • Issue
    10
  • fYear
    2005
  • Firstpage
    2035
  • Lastpage
    2045
  • Abstract
    For demonstrating substrate coupling in high-gain broadband amplifiers, a limiting differential transimpedance amplifier has been developed and fabricated in a SiGe bipolar technology. It operates up to 30 Gb/s and stands out for a maximum (nonlinear) transimpedance in the limiting mode of 25 kΩ, resulting in a gain × speed product as high as 750 kΩ·Gb/s. This record value could be achieved by applying several techniques for suppression of noise coupling simultaneously. The effectiveness of each technique was verified experimentally by measuring the output eye diagrams of different mounted amplifier versions. The high accuracy potential of the substrate modeling tools applied for optimizing the amplifier design has been demonstrated separately by measurements on special (mounted) test structures up to 40 GHz. These investigations also showed the strong degradation of shielding measures by bond inductances with increasing frequency.
  • Keywords
    bipolar integrated circuits; high-speed integrated circuits; integrated circuit measurement; interference suppression; substrates; wideband amplifiers; 25 kohm; 30 Gbit/s; high-speed bipolar circuits; limiting differential transimpedance amplifier; noise coupling; substrate coupling; transimpedance amplifiers; Bonding; Broadband amplifiers; Circuit testing; Coupling circuits; Germanium silicon alloys; Optical amplifiers; Optical receivers; Semiconductor optical amplifiers; Silicon germanium; Substrates; Substrate coupling; high-speed bipolar circuits; noise suppression; transimpedance amplifiers;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.2005.852825
  • Filename
    1506891