DocumentCode
1162563
Title
Substrate coupling in a high-gain 30-Gb/s SiGe amplifier-modeling, suppression, and measurement
Author
Steiner, Wolfgang ; Rein, Hans-Martin ; Berntgen, Jürgen
Author_Institution
Ruhr-Univ. Bochum, Germany
Volume
40
Issue
10
fYear
2005
Firstpage
2035
Lastpage
2045
Abstract
For demonstrating substrate coupling in high-gain broadband amplifiers, a limiting differential transimpedance amplifier has been developed and fabricated in a SiGe bipolar technology. It operates up to 30 Gb/s and stands out for a maximum (nonlinear) transimpedance in the limiting mode of 25 kΩ, resulting in a gain × speed product as high as 750 kΩ·Gb/s. This record value could be achieved by applying several techniques for suppression of noise coupling simultaneously. The effectiveness of each technique was verified experimentally by measuring the output eye diagrams of different mounted amplifier versions. The high accuracy potential of the substrate modeling tools applied for optimizing the amplifier design has been demonstrated separately by measurements on special (mounted) test structures up to 40 GHz. These investigations also showed the strong degradation of shielding measures by bond inductances with increasing frequency.
Keywords
bipolar integrated circuits; high-speed integrated circuits; integrated circuit measurement; interference suppression; substrates; wideband amplifiers; 25 kohm; 30 Gbit/s; high-speed bipolar circuits; limiting differential transimpedance amplifier; noise coupling; substrate coupling; transimpedance amplifiers; Bonding; Broadband amplifiers; Circuit testing; Coupling circuits; Germanium silicon alloys; Optical amplifiers; Optical receivers; Semiconductor optical amplifiers; Silicon germanium; Substrates; Substrate coupling; high-speed bipolar circuits; noise suppression; transimpedance amplifiers;
fLanguage
English
Journal_Title
Solid-State Circuits, IEEE Journal of
Publisher
ieee
ISSN
0018-9200
Type
jour
DOI
10.1109/JSSC.2005.852825
Filename
1506891
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