An improved Spice2 Zener diode model for soft-region simulation capability

Author

Piotrowski, Leo R.

Author_Institution

Harris Corp., Melbourne, FL, USA

Volume

7

Issue

12

fYear

1988

fDate

12/1/1988 12:00:00 AM

Firstpage

1301

Lastpage

1303

Abstract

A Spice2-compatible reverse diode model is formulated in which improvements are made to reverse low current leakage region. In addition, the diode parasitic series resistance is included in the breakdown region of the model and forces the model parameters IBV and BV to describe the terminal characteristics, as opposed to the internal diode component as in Spice2. The proposed model has been implemented in a special version of Spice2 and the results of the simulations are presented. The results show potential for improved integrated-circuit simulation reliability due to the extended capability of the Zener reference diode model

Keywords

Zener diodes; semiconductor device models; Spice2 Zener diode model; breakdown region; diode parasitic series resistance; internal diode component; low current leakage region; model parameters; reverse diode model; soft-region simulation capability; terminal characteristics; Breakdown voltage; Circuit simulation; Data acquisition; Electric breakdown; Impurities; Integrated circuit modeling; Integrated circuit reliability; Low earth orbit satellites; Monolithic integrated circuits; Semiconductor diodes;

fLanguage

English

Journal_Title

Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on

Publisher

ieee

ISSN

0278-0070

Type

jour

DOI

10.1109/43.16808

Filename

16808