• DocumentCode
    1165496
  • Title

    Boundary scan test standards

  • Author

    Ashenden, Peter J.

  • Author_Institution
    Ashenden Designs, Stirling, SA, Australia
  • Volume
    20
  • Issue
    1
  • fYear
    2003
  • Firstpage
    91
  • Lastpage
    92
  • Abstract
    I give an overview of several standards defining test technology based on boundary scan. The Test Technology Technical Council (MC), an IEEE Computer Society technical committee, sponsors these standards.
  • Keywords
    IEEE standards; boundary scan testing; IEEE Computer Society technical committee; Test Technology Technical Council; boundary scan test standards; Conferences; EPROM; Electronics industry; Field programmable gate arrays; Flash memory; Programmable logic devices; Read only memory; Standards development; System-on-a-chip; Testing;
  • fLanguage
    English
  • Journal_Title
    Design & Test of Computers, IEEE
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/MDT.2003.1189240
  • Filename
    1189240
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1165496