• DocumentCode
    116615
  • Title

    Modified effective index method to fit the phase and group index in 3D photonic wire waveguide

  • Author

    Tsarev, A.V.

  • Author_Institution
    SB, A.V. Rzhanov Inst. of Semicond. Phys., Novosibirsk, Russia
  • fYear
    2014
  • fDate
    2-4 Oct. 2014
  • Firstpage
    449
  • Lastpage
    451
  • Abstract
    A modified effective index method (MEIM), which correctly describes, in a 2D case, both the phase and the group indexes in a 3D photonic wire, is discussed in the paper. MEIM utilizes the combined index profile with two spatial parameters. A central part has a wire index and a width of a nearly wire height. A basic part has a width of 3D wire and a fitting index Nb. Numerical experiments by FDTD of Ring resonator and multi-splitting multiplexer, Fabry-Perot and asymmetric Mach-Zehnder interferometers constructed by silicon wires prove that the MEIM gives an excellent agreement (about 2%) with test 3D simulation in comparison with an about 30%-45% error for EIM. MEIM is preferable for simulation of SOI filtering structures by 2D FDTD.
  • Keywords
    Fabry-Perot interferometers; Mach-Zehnder interferometers; finite difference time-domain analysis; integrated optics; niobium; optical waveguides; wires; 2D FDTD; 3D photonic wire waveguide; Fabry-Perot interferometers; Nb; SOI filtering structures; Si; asymmetric Mach-Zehnder interferometers; fitting index; modified effective index method; multisplitting multiplexer; ring resonator; silicon wires; wire height; wire index; Finite difference methods; Indexes; Optical filters; Optical ring resonators; Optical waveguides; Three-dimensional displays; Wires; Effective index method; Finite difference methods; Integrated optics; Numerical simulation; Optical waveguides; Silicon-on-insulator;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Actual Problems of Electronics Instrument Engineering (APEIE), 2014 12th International Conference on
  • Conference_Location
    Novosibirsk
  • Print_ISBN
    978-1-4799-6019-4
  • Type

    conf

  • DOI
    10.1109/APEIE.2014.7040719
  • Filename
    7040719