Proton radiation effects in XC4036XLA field programmable gate arrays

Author

Buchanan, N.J. ; Gingrich, D.M.

Author_Institution

Centre For Subatomic Res., Univ. of Alberta, Edmonton, Alta., Canada

Volume

50

Issue

2

fYear

2003

fDate

4/1/2003 12:00:00 AM

Firstpage

263

Lastpage

271

Abstract

We have measured the proton-induced single-event upset (SEU) cross section of Xilinx XC4036XLA field programmable gate arrays. The threshold energy for SEU was determined to be (22±2) MeV. The upset cross section saturated at a value of (2.7±0.2)×10^-9 cm²/device. We have demonstrated that Bendel models are unable to describe the upset cross section. The effects of the radiation environment of the liquid argon calorimeter of the ATLAS detector on the XC4036XLA were estimated.

Keywords

argon; field programmable gate arrays; liquid scintillation detectors; nuclear electronics; particle calorimetry; position sensitive particle detectors; proton effects; readout electronics; 22 MeV; ATLAS detector; Ar; Bendel models; FPGA; SEU; XC4036XLA field programmable gate arrays; Xilinx XC4036XLA; liquid argon calorimeter; proton radiation effects; radiation environment; single-event upset; upset cross section; Application specific integrated circuits; Argon; Costs; Field programmable gate arrays; Predictive models; Proton radiation effects; Radiation detectors; Radiation effects; Single event upset; Structural beams;

fLanguage

English

Journal_Title

Nuclear Science, IEEE Transactions on

Publisher

ieee

ISSN

0018-9499

Type

jour

DOI

10.1109/TNS.2003.809468

Filename

1190044