Analysis of Total-Dose Response of a Bipolar Voltage Comparator Combining Radiation Experiments and Design Data

Author

Dusseau, L. ; Bernard, M.F. ; Boch, J. ; Vaillé, J. -R ; Saigné, F. ; Schrimpf, R.D. ; Lorfèvre, E. ; David, J.P.

Author_Institution

Univ. Montpellier II

Volume

53

Issue

4

fYear

2006

Firstpage

1910

Lastpage

1916

Abstract

A contribution to the understanding of total dose degradation using both AC small signal analysis and DC analysis in linear bipolar circuits is proposed. The reasoning is illustrated step by step on the basis of experimental results obtained on the LM 139. It is shown that the input stage is mostly responsible for the degradation up to 20 krad. Above 20 krad, the total degradation is due to a combination of the input and the output stage degradation. The amplifier stage does not play a significant role in the circuit degradation

Keywords

bipolar analogue integrated circuits; comparators (circuits); radiation effects; AC small signal analysis; DC analysis; amplifier; integrated circuits; linear bipolar voltage comparator; radiation experiment; total-dose degradation; Analog circuits; Analog integrated circuits; Bipolar integrated circuits; Bipolar transistors; Circuit testing; Degradation; Failure analysis; Radiation effects; Signal analysis; Voltage; Bipolar analog circuits; circuitry; integrated circuits (ICs); linear voltage comparator; total dose;

fLanguage

English

Journal_Title

Nuclear Science, IEEE Transactions on

Publisher

ieee

ISSN

0018-9499

Type

jour

DOI

10.1109/TNS.2006.880950

Filename

1684037