Characterization of shielded coplanar type transmission line junction discontinuities incorporating the finite metallization thickness effect

Author

Kuo, Chih-Wen ; Itoh, Tatsuo

Author_Institution

Dept. of Electr. & Comput. Eng., Texas Univ., Austin, TX, USA

Volume

40

Issue

1

fYear

1992

fDate

1/1/1992 12:00:00 AM

Firstpage

73

Lastpage

80

Abstract

Frequency-dependent characteristics of shielded junction discontinuities between coplanar type transmission lines, specifically coplanar waveguide (CPW) and finline, are analyzed by the mode-matching technique. The effect of finite metallization thickness is also incorporated in the analysis for the first time. Scattering parameters of finline step discontinuity are compared with existing data to confirm the accuracy of the approach. Numerical results for finline step discontinuity, shielded CPW step discontinuity and CPW-finline transition are presented

Keywords

S-parameters; metallisation; strip lines; waveguide theory; CPW-finline transition; eigenmodes; finite metallization thickness effect; frequency dependent characteristics; junction discontinuities; mode-matching technique; scattering parameters; shielded coplanar type; step discontinuity; transmission line; Circuits; Coplanar transmission lines; Coplanar waveguides; Electromagnetic waveguides; Finline; MMICs; Metallization; Microstrip; Transmission line discontinuities; Waveguide junctions;

fLanguage

English

Journal_Title

Microwave Theory and Techniques, IEEE Transactions on

Publisher

ieee

ISSN

0018-9480

Type

jour

DOI

10.1109/22.108325

Filename

108325