• DocumentCode
    1171046
  • Title

    Monolithically integrated high-power broad-band RF switch based on III-N insulated gate transistors

  • Author

    Koudymov, A. ; Rai, S. ; Adivarahan, V. ; Gaevski, M. ; Yang, J. ; Simin, G. ; Khan, M.A.

  • Author_Institution
    Dept. of Electr. Eng., Univ. of South Carolina, Columbia, SC, USA
  • Volume
    14
  • Issue
    12
  • fYear
    2004
  • Firstpage
    560
  • Lastpage
    562
  • Abstract
    We report on the high-performance monolithically integrated RF switch based on metal-oxide-semiconductor III-N heterostructure field-effect transistors (MOSHFETs). The radio frequency (RF) switch microwave monolithic integrated circuit (MMIC) consists of three submicron-gate MOSHFETs connected into π-type configuration. In the 0-10 GHz frequency range, the insertion loss is less than 1dB and the isolation is better than 20 dB. The switching powers well exceed 20 W per 1mm of the active element width. The high performance parameters of the switch are achieved due to unique properties of III-nitride MOSHFET, which combines a low channel resistance and high breakdown voltage features of AlGaN/GaN HFETs and extremely low gate leakage currents, large gate voltage swing and low gate capacitance specific to insulated gate design. The combination of these parameters makes MOSHFETs excellent candidates for high-power switching. The experimental data obtained from the RF switch are in close agreement with the results of simulations.
  • Keywords
    III-V semiconductors; MMIC; MOS integrated circuits; MOSFET; aluminium compounds; gallium compounds; leakage currents; microswitches; microwave switches; 0 to 10 GHz; AlGaN-GaN; AlGaN/GaN HFET; HEMT; III-N insulated gate transistors; III-nitride MOSHFET; RF switch microwave monolithic integrated circuit; active element width; high breakdown voltage; high-power broad-band RF switch; high-power switching; insertion loss; insulated gate design; large gate voltage swing; low channel resistance; low gate capacitance; low gate leakage currents; metal-oxide-semiconductor III-N HFET; monolithically integrated RF switch; submicron-gate MOSHFET; Field effect MMICs; HEMTs; Insulation; MODFETs; MOSHFETs; Microwave transistors; Monolithic integrated circuits; Radio frequency; Switches; Switching circuits; 65; FET; Field-effect transistor; GaN; HEMT; HFET; MOSHFET; RF; heterostructure field-effect transistor; metal-oxide-semiconductor III-N heterostructure field-effect transistor; switch; wireless;
  • fLanguage
    English
  • Journal_Title
    Microwave and Wireless Components Letters, IEEE
  • Publisher
    ieee
  • ISSN
    1531-1309
  • Type

    jour

  • DOI
    10.1109/LMWC.2004.837381
  • Filename
    1362668