• DocumentCode
    1171168
  • Title

    Fault isolation via components simulation

  • Author

    Saeks, R. ; Singh, Sushil ; Liu, Ruey-wen

  • Volume
    19
  • Issue
    6
  • fYear
    1972
  • fDate
    11/1/1972 12:00:00 AM
  • Firstpage
    634
  • Lastpage
    640
  • Abstract
    The problem of deducing the internal component parameters from external measurements of a large-scale system is studied in the context of the fault isolation problem. By assuming an appropriate algebraic connection model matrix, algebraic necessary and sufficient conditions for the exact determination of the internal component parameters are obtained for both the single-test frequency and multiple-test frequency cases. In both cases the linear independence of the rows or columns of certain matrices may be used to determine appropriate test points and test frequencies.
  • Keywords
    Fault isolation, large-scale systems; General circuit theory; Interconnected systems; Active circuits; Circuit faults; Circuit testing; Electrical fault detection; Frequency; Helium; Integrated circuit technology; Large-scale systems; Matrices; System testing;
  • fLanguage
    English
  • Journal_Title
    Circuit Theory, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9324
  • Type

    jour

  • DOI
    10.1109/TCT.1972.1083560
  • Filename
    1083560