DocumentCode
1171168
Title
Fault isolation via components simulation
Author
Saeks, R. ; Singh, Sushil ; Liu, Ruey-wen
Volume
19
Issue
6
fYear
1972
fDate
11/1/1972 12:00:00 AM
Firstpage
634
Lastpage
640
Abstract
The problem of deducing the internal component parameters from external measurements of a large-scale system is studied in the context of the fault isolation problem. By assuming an appropriate algebraic connection model matrix, algebraic necessary and sufficient conditions for the exact determination of the internal component parameters are obtained for both the single-test frequency and multiple-test frequency cases. In both cases the linear independence of the rows or columns of certain matrices may be used to determine appropriate test points and test frequencies.
Keywords
Fault isolation, large-scale systems; General circuit theory; Interconnected systems; Active circuits; Circuit faults; Circuit testing; Electrical fault detection; Frequency; Helium; Integrated circuit technology; Large-scale systems; Matrices; System testing;
fLanguage
English
Journal_Title
Circuit Theory, IEEE Transactions on
Publisher
ieee
ISSN
0018-9324
Type
jour
DOI
10.1109/TCT.1972.1083560
Filename
1083560
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