• DocumentCode
    1173024
  • Title

    Empirical analysis of CK metrics for object-oriented design complexity: implications for software defects

  • Author

    Subramanyam, Ramanath ; Krishnan, M.S.

  • Author_Institution
    Univ. of Michigan Bus. Sch., USA
  • Volume
    29
  • Issue
    4
  • fYear
    2003
  • fDate
    4/1/2003 12:00:00 AM
  • Firstpage
    297
  • Lastpage
    310
  • Abstract
    To produce high quality object-oriented (OO) applications, a strong emphasis on design aspects, especially during the early phases of software development, is necessary. Design metrics play an important role in helping developers understand design aspects of software and, hence, improve software quality and developer productivity. In this paper, we provide empirical evidence supporting the role of OO design complexity metrics, specifically a subset of the Chidamber and Kemerer (1991, 1994) suite (CK metrics), in determining software defects. Our results, based on industry data from software developed in two popular programming languages used in OO development, indicate that, even after controlling for the size of the software, these metrics are significantly associated with defects. In addition, we find that the effects of these metrics on defects vary across the samples from two programming languages-C++ and Java. We believe that these results have significant implications for designing high-quality software products using the OO approach.
  • Keywords
    object-oriented programming; program debugging; software metrics; C++; CK metric analysis; Java; OO design complexity metrics; object-oriented design complexity; software defect determination; software defects; software development; software quality; Application software; Computer industry; Computer languages; Industrial control; Java; Productivity; Programming; Size control; Software design; Software quality;
  • fLanguage
    English
  • Journal_Title
    Software Engineering, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0098-5589
  • Type

    jour

  • DOI
    10.1109/TSE.2003.1191795
  • Filename
    1191795