• DocumentCode
    1173094
  • Title

    Parameter estimation of double exponential pulses (EMP, UWB) with least squares and Nelder Mead algorithm

  • Author

    Camp, Michael ; Garbe, Heyno

  • Author_Institution
    Inst. for Electr. Eng. & Meas. Sci., Univ. of Hanover, Germany
  • Volume
    46
  • Issue
    4
  • fYear
    2004
  • Firstpage
    675
  • Lastpage
    678
  • Abstract
    Transient test pulses like electromagnetic pulse and ultrawide-band are commonly described by rise time tr, pulse length tfwhm and the maximum amplitude Eˆ. Simulating the effects of varying pulses an analytical description of the pulses is necessary, which is given by a double exponential form with the parameters α, β and E0. This paper describes the link between the parameters tr, tfwhm and Eˆ on the one side and the analytical parameters α, β and E0 on the other side. It is shown that the Nelder Mead simplex algorithm in combination with the least squares method is appropriate to determine an analytical relationship between these parameters. There with extensive analysis of double exponential pulse shapes with far-ranging parameters is possible in a considerably smaller computing time.
  • Keywords
    electromagnetic interference; electromagnetic pulse; exponential distribution; least squares approximations; parameter estimation; EMP; Nelder Mead simplex algorithm; UWB; double exponential pulses; electromagnetic pulse; least square method; parameter estimation; transient testpulses; ultra wideband pulse; Algorithm design and analysis; Analytical models; EMP radiation effects; Electromagnetic transients; Least squares approximation; Least squares methods; Parameter estimation; Pulse shaping methods; Shape; Testing; 65; Double exponential pulse shape; EMP; HPEM; IEMI; Intentional Electromagnetic Interference; Nelder Mead; UWB; electromagnetic pulse; high-power electromagnetics; least squares; parameter; ultrawide-band;
  • fLanguage
    English
  • Journal_Title
    Electromagnetic Compatibility, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9375
  • Type

    jour

  • DOI
    10.1109/TEMC.2004.838228
  • Filename
    1362884