• DocumentCode
    1174378
  • Title

    Large band offset short calibration procedure for vector network analysers

  • Author

    Migliore, M.D.

  • Author_Institution
    DAEIMI, Universita degli Studi di Cassino, Italy
  • Volume
    39
  • Issue
    6
  • fYear
    2003
  • fDate
    3/20/2003 12:00:00 AM
  • Firstpage
    534
  • Lastpage
    535
  • Abstract
    A method to evaluate the positions of the short circuit to obtain a stable offset short calibration in an arbitrarily large frequency range is presented. The method is tested by evaluating the permittivity of a sample of fibreglass placed in a waveguide using the Von Hippel method.
  • Keywords
    calibration; microwave measurement; network analysers; permittivity measurement; Von Hippel method; fibreglass; offset short calibration; permittivity measurement; short circuit; vector network analyser; waveguide;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:20030343
  • Filename
    1192215
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1174378