Radiation damage to tetramethlysilane and tetramethlygermanium ionization chambers

Author

Hoshi, Y. ; Higuchi, M. ; Oyama, K. ; Akaishi, H. ; Yuta, H. ; Abe, K. ; Hasegawa, K. ; Suekane, F. ; Nagamine, T. ; Kawamura, N. ; Neichi, K. ; Katayama, J. ; Nakajima, T. ; Masuda, K. ; Kikuchi, R. ; Miyano, K.

Author_Institution

Dept. of Appl. Phys., Tohoku Gakuin Univ., Tagajo, Japan

Volume

41

Issue

4

fYear

1994

fDate

8/1/1994 12:00:00 AM

Firstpage

853

Lastpage

855

Abstract

Two detector media suitable for a warm liquid ionization chamber filled with tetramethylsilane (TMS) and tetramethylgermanium (TMG) were exposed to γ-radiation from a ⁶⁰Co source up to a dose of 579 Gray and 902 Gray, respectively. The electron lifetimes and the free ion yields were measured as a function of accumulated radiation dose. A similar behavior of the electron lifetimes and the free ion yields with increasing radiation dose was observed between the TMS and TMG ionization chambers

Keywords

gamma-ray effects; ionisation chambers; γ irradiation; 579 Gy; 902 Gy; TMG ionization chamber; TMS ionization chamber; electron lifetimes; free ion yields; radiation damage; radiation dose; Cathodes; Charge measurement; Current measurement; Electron mobility; Energy measurement; Ionization chambers; Ionizing radiation; Physics; Purification; Steel;

fLanguage

English

Journal_Title

Nuclear Science, IEEE Transactions on

Publisher

ieee

ISSN

0018-9499

Type

jour

DOI

10.1109/23.322819

Filename

322819