High-resolution measurement of birefringence profiles in stress-induced polarization-maintaining fibers

Author

Loch, Manfred ; Heinlein, Walter E.

Author_Institution

Dept. of Theor. Electr. Eng. & Opt. Commun., Kaiserslautern Univ., West Germany

Volume

7

Issue

8

fYear

1989

fDate

8/1/1989 12:00:00 AM

Firstpage

1213

Lastpage

1216

Abstract

A novel technique for measuring the local refractive-index anisotropy in stress-induced polarization-maintaining fibers is presented. This technique is an extension of the well-known refracted near-field method for high-resolution measurement of refractive-index profiles. The application of this technique to two different types of fiber reveals birefringence profiles as well as differential stress profiles. Calculated birefringent profiles determined by means of a finite-element method are in good agreement with measured ones. Interferometrically measured modal birefringence verified corresponding data obtained from birefringence profiles

Keywords

fibre optics; light polarisation; mechanical birefringence; optical fibres; refractive index measurement; birefringence profiles; differential stress profiles; finite-element method; high-resolution measurement; interferometrically measured modal birefringence; local refractive-index anisotropy measurement; refracted near-field method; refractive-index profiles; stress-induced polarization-maintaining fibers; Anisotropic magnetoresistance; Birefringence; Optical fiber communication; Optical fiber polarization; Optical fiber sensors; Optical fiber testing; Optical fiber theory; Optical refraction; Stress measurement; Thermal stresses;

fLanguage

English

Journal_Title

Lightwave Technology, Journal of

Publisher

ieee

ISSN

0733-8724

Type

jour

DOI

10.1109/50.32385

Filename

32385