DocumentCode
1180700
Title
A Silicon Diode Circuit for Direct Measurement of the WBGT Thermal Stress Index
Author
Lupu, N.Z.
Author_Institution
Physics Dept. of the Technion, Haifa, Israel.
Issue
1
fYear
1965
Firstpage
40
Lastpage
43
Abstract
A simple instrument is described for the assessment of a thermal environment by continuous monitoring and computation of the Wet-Bulb Globe Thermometer (WBGT) heat stress index. Silicon diodes are used as the temperature transducers. A simple resistive network for weighted summation of the voltages has been developed. The instrument is battery-operated and suitable for laboratory and field work. Monitoring and recording is possible from a remote site.
Keywords
Circuits; Diodes; Instruments; Monitoring; Silicon; Stress measurement; Temperature; Thermal stresses; Transducers; Voltage; Electronics; Engineering; Thermometers;
fLanguage
English
Journal_Title
Biomedical Engineering, IEEE Transactions on
Publisher
ieee
ISSN
0018-9294
Type
jour
DOI
10.1109/TBME.1965.4502339
Filename
4502339
Link To Document