• DocumentCode
    1182261
  • Title

    Sequentially linear fault diagnosis: Part II-The design of diagnosable systems

  • Author

    Visvanathan, V. ; Liu, Ruey-Wen

  • Volume
    26
  • Issue
    7
  • fYear
    1979
  • fDate
    7/1/1979 12:00:00 AM
  • Firstpage
    558
  • Lastpage
    564
  • Abstract
    Based on the results developed in Part I a strategy of test point location by which the parameters of an LSDS are made diagnosable in a generic sense, is developed. By appropriate test point placement, an LSDS is reduced to a canonical LSDS. Next, an algorithm for the synthesis of the test points required to make the parameters of the canonical LSDS sequentially linearly diagnosable in a generic sense, is given.
  • Keywords
    Analog integrated circuits; Fault diagnosis; Integrated circuits, analog; Interconnected systems; Linear systems, time-invariant continuous-time; Special designs; Circuit synthesis; Circuit testing; Detectors; Fault diagnosis; Seminars; Sequential analysis; Sequential diagnosis; Signal generators; Sufficient conditions; System testing;
  • fLanguage
    English
  • Journal_Title
    Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0098-4094
  • Type

    jour

  • DOI
    10.1109/TCS.1979.1084673
  • Filename
    1084673