DocumentCode
1188978
Title
Spatial and temporal characteristics of energy deposition by protons and alpha particles in silicon
Author
Kobayashi, Aaron S. ; Sternberg, AndrewL ; Massengill, LloydW ; Schrimpf, Ronald D. ; Weller, Robert A.
Author_Institution
Vanderbilt Univ., Nashville, TN, USA
Volume
51
Issue
6
fYear
2004
Firstpage
3312
Lastpage
3317
Abstract
We present spatial and temporal distributions of energy deposition in silicon obtained from Monte Carlo simulations with Geant4. Detailed simulations are performed for protons and alphas over a wide energy range and include contributions from discrete δ-rays and nuclear reactions. The simulation technique we employ produces physically realistic complex track structures for which the plausibility is evaluated by comparison to the linear energy transfer, radial dose, and temporal characteristics described in previous works. The variability of events, including the distribution of energy deposition at varying distances from the ion track is discussed. Finally, we examine the temporal evolution of extreme events to investigate the physicality of the common assumption that energy deposition can be considered instantaneous.
Keywords
MIS devices; Monte Carlo methods; alpha particle-nucleus reactions; alpha-particle effects; nuclei with mass number 20 to 38; particle tracks; physics computing; proton effects; proton-nucleus reactions; radiation detection; silicon; spatiotemporal phenomena; Geant4; MOS; Monte Carlo simulations; Si; Si(alpha,X); Si(p,X); alpha particles; discrete delta-rays; energy deposition; ion track; linear energy transfer; metal oxide semiconductor; nuclear reactions; physically realistic complex track structures; protons; radial dose; radiation effects; silicon; simulation technique; single-event effects; spatial characteristics; temporal characteristics; Alpha particles; Detectors; Discrete event simulation; Energy exchange; Insulation life; Physics; Predictive models; Protons; Silicon; Testing;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.2004.839176
Filename
1369487
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