• DocumentCode
    1188994
  • Title

    High-speed observations of arc modes and material erosion on RMF- and AMF-contact electrodes

  • Author

    Gentsch, Dietmar ; Shang, Wenkai

  • Author_Institution
    ABB AG - Calor Emag Mittelspannungsprodukte, Ratingen, Germany
  • Volume
    33
  • Issue
    5
  • fYear
    2005
  • Firstpage
    1605
  • Lastpage
    1610
  • Abstract
    Vacuum interrupters, particularly with high short-circuit interruption ability, are mostly equipped with contact systems based on two different principles: the widely used radial magnetic field (RMF) contact and the axial magnetic field (AMF) contact system. In this investigation, contact electrodes performance of an improved RMF system was compared with both an unipolar and a quadrupolar AMF contact system. By using a high-speed complementary metal oxide semiconductor digital video camera, the different systems were observed during arcing under short-circuit conditions at different current levels, concentrating on arc modes development with different arcing times. Contact erosion and thermal stress of the high-current vacuum arc on the contacts was basically evaluated on the basis of contact melting depth, with the result of comparable melting depths at insignificantly higher thermal stress of the RMF versus AMF systems. The microstructure of the copper and chromium compound contact material cross section was analyzed by means of a scanning electron microscope.
  • Keywords
    chromium; copper; melting; plasma diagnostics; plasma instability; plasma-wall interactions; scanning electron microscopy; thermal stresses; vacuum arcs; vacuum interrupters; Cu-Cr; arc modes; axial magnetic field contact; chromium compound; complementary metal oxide semiconductor; contact electrodes; contact melting; copper compound; current levels; digital video camera; material erosion; microstructure; radial magnetic field contact; scanning electron microscope; short-circuit interruption; thermal stress; vacuum arc; vacuum interrupters; Copper; Digital cameras; Electrodes; Interrupters; Magnetic fields; Magnetic materials; Microstructure; Thermal stresses; Vacuum arcs; Vacuum systems; Arcing time; axial magnetic field (AMF); contact erosion; contact material; contact melting depth; contact systems; copper and chromium; high-speed observation of vacuum arcs; radial magnetic field (RMF); vacuum arc; vacuum interrupter (VI);
  • fLanguage
    English
  • Journal_Title
    Plasma Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0093-3813
  • Type

    jour

  • DOI
    10.1109/TPS.2005.856514
  • Filename
    1518985