• DocumentCode
    1189408
  • Title

    Analyses of images of neutron interactions and single particle displacement damage in CCD arrays

  • Author

    Chugg, A.M. ; Jones, R. ; Moutrie, M.J. ; Truscott, P.R.

  • Author_Institution
    Radiat. Effects Group, MBDA UK Ltd., Bristol, UK
  • Volume
    51
  • Issue
    6
  • fYear
    2004
  • Firstpage
    3579
  • Lastpage
    3584
  • Abstract
    The purpose of this work is to understand the interaction of high energy neutrons with CCDs with the aim of deploying them in flight experiments to gather a database of atmospheric neutron interaction events in silicon cells. The new results in this paper include: 1) early-time multilevel RTS signals from dark current spikes, which have never been resolved before and 2) improved resolution of the frequency distributions of event intensity and comparison with results from a radiation transport code. This work adds to the state of the art by providing a novel perspective on the formation and evolution (annealing) of displacement damage complexes in silicon and by demonstrating that CCDs can provide an attractive combination of spatial and intensity resolution for the interaction events of neutrons and other particles within silicon cells.
  • Keywords
    annealing; charge-coupled device circuits; neutron effects; particle tracks; reviews; APS; CCD arrays; GEANT4; annealing; atmospheric neutron interaction; charge collection efficiency; dark current spikes; flight experiments; frequency distributions; high energy neutron interactions; image analysis; intensity resolution; multilevel random telegraph signal; particle tracks; radiation transport code; reviews; silicon cells; single particle displacement damage; spatial resolution; transient events; Annealing; Charge coupled devices; Dark current; Energy resolution; Frequency; Image analysis; Image databases; Neutrons; Signal resolution; Silicon;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.2004.839164
  • Filename
    1369528