• DocumentCode
    1189594
  • Title

    Effects of beam spot size on the correlation between laser and heavy ion SEU testing

  • Author

    Miller, Florent ; Buard, Nadine ; Carrière, Thierry ; Dufayel, Richard ; Gaillard, Rémi ; Poirot, Patrick ; Palau, Jean-Marie ; Sagnes, Bruno ; Fouillat, Pascal

  • Author_Institution
    Corporate Res. Center, Eur. Aeronaut. Defence & Space Co., Suresnes, France
  • Volume
    51
  • Issue
    6
  • fYear
    2004
  • Firstpage
    3708
  • Lastpage
    3715
  • Abstract
    This work presents new results to compare EADS CCR laser experiments and heavy ion tests. More precisely, this study describes the influence of the laser spot size on the threshold energy of the SEU cross-section curves. A new methodology is proposed to correlate laser to heavy ion results.
  • Keywords
    SRAM chips; ion beam effects; laser beam effects; EADS CCR laser experiments; SRAM; beam spot size effects; heavy ion single event upset testing; laser spot size; single event effect; single event upset cross-section curves; threshold energy; Absorption; Ion accelerators; Ionization; Laser beams; Laser theory; Pulsed laser deposition; Random access memory; Silicon; Single event upset; Testing;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.2004.839261
  • Filename
    1369547
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1189594