DocumentCode
1189980
Title
Multibit MRAM using a pair of memory cells
Author
Lim, Chee Kheng ; Kim, Yong Su ; Park, No Yeol ; Lee, Ju
Author_Institution
Samsung Adv. Inst. of Technol., Suwon, South Korea
Volume
41
Issue
10
fYear
2005
Firstpage
2670
Lastpage
2672
Abstract
Magnetic random access memory (MRAM) is one of the most promising candidates to provide energy-efficient and nonvolatile memory. We present a new MRAM design using a pair of cells where each cell can store two bits of information. The pair cells have a parallelogram shape to induce broken-shape magnetic anisotropy along the short axis of the cell. One important advantage of the pair cells is that they can share the same word- and bit-lines intersection in the MRAM architecture. This means that the number of electrical current lines can be reduced and lead to higher recording density. Such design is successfully demonstrated using finite-element micromagnetic simulation.
Keywords
finite element analysis; magnetic anisotropy; magnetic storage; random-access storage; shape memory effects; electrical current lines; finite-element micromagnetic simulation; magnetic anisotropy; magnetic random access memory; memory cells; multibit MRAM; nonvolatile memory; shape memory effects; Electric resistance; Energy efficiency; Magnetic anisotropy; Magnetic fields; Magnetic separation; Magnetization; Nonvolatile memory; Perpendicular magnetic anisotropy; Random access memory; Shape; Magnetic random access memory (MRAM); shape memory effects;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/TMAG.2005.855288
Filename
1519083
Link To Document