Degradation testing and lifetime predictions for GMR heads under mechanically and thermally accelerated conditions

Author

Imamura, Takahiro ; Yamamoto, Kenrou

Author_Institution

Magnetic Disk Drive Lab., Fujitsu Labs. Ltd., Atsugi, Japan

Volume

41

Issue

10

fYear

2005

Firstpage

3037

Lastpage

3039

Abstract

Testing degradation and predicting the lifetimes of giant magneto-resistive (GMR) heads under mechanically and thermally accelerated conditions are discussed. Our experiments revealed that accumulated mechanical acceleration can cause gradual and continuous head degradation. The amplitude loss was proportional to the integrated acoustic emission (AE) signal, and the amplitude loss rate to the integrated AE was a function of GMR temperature. Lifetime predictions with these parameters are presented.

Keywords

acceleration; acoustic emission; giant magnetoresistance; life testing; magnetic heads; AE; GMR heads; acoustic emission; amplitude loss; degradation testing; giant magnetoresistive heads; head degradation; lifetime prediction; mechanical acceleration; Acceleration; Coils; Contacts; Electrical resistance measurement; Life estimation; Life testing; Magnetic heads; Magnetic separation; Temperature sensors; Thermal degradation; Acoustic emissions (AEs); degradation; giant magneto-resistive (GMR) heads; lifetime predictions;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/TMAG.2005.855257

Filename

1519199