Perpendicular anisotropy of MBE-grown FePt granular films

Author

Itoh, Tomoya ; Kato, Takeshi ; Iwata, Satoshi ; Tsunashima, Shigeru

Author_Institution

Dept. of Electron., Nagoya Univ., Japan

Volume

41

Issue

10

fYear

2005

Firstpage

3217

Lastpage

3219

Abstract

The [001] oriented granular Fe_xPt_1-x films were MBE-grown on MgO [001] single crystal substrates by means of repetitional deposition and annealing of 0.5 nm layers. The physically isolated granular structure and L1₀ ordered phase was obtained by annealing above 350°C and the grain size of 20 nm was achieved in 3 nm thick Fe₃₈Pt₆₂ film. The Fe₅₀Pt₅₀ film annealed at 450°C exhibits large perpendicular anisotropy of 2.0×10⁶ J/m³ and large coercivity beyond 1.2 MA/m.

Keywords

annealing; grain size; granular materials; iron alloys; magnetic epitaxial layers; molecular beam epitaxial growth; perpendicular magnetic anisotropy; 0.5 nm; 20 nm; 3 nm; 450 C; Fe₃₈Pt₆₂; FePt; L1₀ ordered phase; MBE growth; annealing; deposition; grain size; granular films; granular structure; high-density perpendicular media; molecular beam epitaxy; perpendicular magnetic anisotropy; single crystal substrate; Anisotropic magnetoresistance; Annealing; Grain size; Iron; Magnetic films; Molecular beam epitaxial growth; Perpendicular magnetic anisotropy; Perpendicular magnetic recording; Substrates; Temperature; FePt; MBE-growth; granular film; high-density perpendicular media; perpendicular magnetic anisotropy;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/TMAG.2005.854782

Filename

1519258