• DocumentCode
    1192591
  • Title

    Prototype of Phase-Change Channel Transistor for Both Nonvolatile Memory and Current Control

  • Author

    Hosaka, Sumio ; Miyauchi, Kunihiro ; Tamura, Takuro ; Yin, You ; Sone, Hayato

  • Author_Institution
    Dept. of Electron. Eng., Gunma Univ., Kiryu
  • Volume
    54
  • Issue
    3
  • fYear
    2007
  • fDate
    3/1/2007 12:00:00 AM
  • Firstpage
    517
  • Lastpage
    523
  • Abstract
    We prototyped phase-change (PC) channel transistors and demonstrated two functions of nonvolatile memory and channel current control. We have developed prototype transistors that use a PC channel instead of a silicon channel. The PC material of a Ge2Sb2Te5 thin film with a thickness of 50 nm was used. We demonstrated a memory function whereby we achieved a reversible change between the crystalline and amorphous phases by applying a source-drain (SD) voltage for Joule heating. In the experiment, the applied voltages for PC between amorphous and crystalline phases were from 5 to 8 V. Control of the channel current was realized by applying a gate bias. The SD current was suppressed to less than 1/20 of that at a gate bias of -3 V by applying a gate bias of 0-3 V
  • Keywords
    annealing; random-access storage; transistors; Ge2Sb2Te5; PC; annealing; channel current control; channel transistor; melting; nonvolatile memory; one transistor cell; phase change; prototype; Amorphous materials; Crystalline materials; Crystallization; Current control; Nonvolatile memory; Phase change materials; Prototypes; Silicon; Tellurium; Transistors; Annealing; GeSbTe; channel current control; melting; nonvolatile memory; one-transistor cell; phase change (PC);
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2006.890386
  • Filename
    4114844