• DocumentCode
    1193124
  • Title

    Decentralized Diagnosis of Event-Driven Systems for Safely Reacting to Failures

  • Author

    Qiu, Wenbin ; Wen, Qin ; Kumar, Ratnesh

  • Author_Institution
    Sullivan Park Res. Center, Corning Inc., Corning, NY
  • Volume
    6
  • Issue
    2
  • fYear
    2009
  • fDate
    4/1/2009 12:00:00 AM
  • Firstpage
    362
  • Lastpage
    366
  • Abstract
    We introduce the notion of safe-codiagnosability, extending the notion of safe-diagnosability (Paoli and Lafortune, 2005) to the decentralized setting. For a system, a certain subbehavior is deemed safe (captured via a safety specification), and a further subbehavior is deemed nonfaulty (captured via a nonfault specification). Safe-codiagnosability requires that when the system executes a trace that is faulty, there exists at least one diagnoser that can detect this within bounded delay and also before the safety specification is violated. The above notion of safe-codiagnosability may also be viewed as an extension of the notion of codiagnosability (Qiu and Kumar, 2006), where the latter did not have any safety requirement. We show that safe-codiagnosability is equivalent to codiagnosability together with ldquozero-delay codiagnosabilityrdquo of ldquoboundary safe tracesrdquo. (A safe trace is a boundary safe trace if there exists a single-event extension that is unsafe.) We give an algorithm of polynomial complexity for verifying safe-codiagnosability. For a safe-codiagnosable system, the same methods as those proposed in (Qiu and Kumar, 2006) can be applied for offline synthesis of individual diagnosers, as well as for online diagnosis using them.
  • Keywords
    discrete event systems; failure analysis; fault diagnosis; multivariable systems; boundary safe traces; decentralized failure diagnosis; event-driven systems; polynomial complexity; safe-codiagnosability; Decentralized systems; discrete-event systems (DESs); fault diagnosis; safety analysis;
  • fLanguage
    English
  • Journal_Title
    Automation Science and Engineering, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1545-5955
  • Type

    jour

  • DOI
    10.1109/TASE.2008.2009093
  • Filename
    4801533