DocumentCode
1194872
Title
Automatic Measuring System for a Control of Standard Cells
Author
Hirayama, Hiroyuki ; Murayama, Yasushi
Volume
21
Issue
4
fYear
1972
Firstpage
379
Lastpage
384
Abstract
The automatic measuring system developed in the Electrotechnical Laboratory to monitor standard cells requiring a lot of measurements is described. It is composed of a scanner, an integrating-type digital voltmeter, a programmer or minicomputer, etc., and carries out the data acquisition and processing for a maximum of 200 cells. The difference in EMF of two cells is measured precisely. To reduce the effect of the induced EMF in the scanner, a delay unit is provided, and procedures minimizing errors and evaluating random errors have been adopted. In the on-line version of system, a great part of the data processing is done during the delay and integrating time of digital voltmeter. Applying this system to the measurement of standard cells, a precision of the order of 0.1 ¿V has been obtained.
Keywords
Automatic control; Computerized monitoring; Control systems; Delay effects; Laboratories; Measurement standards; Microcomputers; Programming profession; Standards development; Voltmeters;
fLanguage
English
Journal_Title
Instrumentation and Measurement, IEEE Transactions on
Publisher
ieee
ISSN
0018-9456
Type
jour
DOI
10.1109/TIM.1972.4314049
Filename
4314049
Link To Document