• DocumentCode
    1194872
  • Title

    Automatic Measuring System for a Control of Standard Cells

  • Author

    Hirayama, Hiroyuki ; Murayama, Yasushi

  • Volume
    21
  • Issue
    4
  • fYear
    1972
  • Firstpage
    379
  • Lastpage
    384
  • Abstract
    The automatic measuring system developed in the Electrotechnical Laboratory to monitor standard cells requiring a lot of measurements is described. It is composed of a scanner, an integrating-type digital voltmeter, a programmer or minicomputer, etc., and carries out the data acquisition and processing for a maximum of 200 cells. The difference in EMF of two cells is measured precisely. To reduce the effect of the induced EMF in the scanner, a delay unit is provided, and procedures minimizing errors and evaluating random errors have been adopted. In the on-line version of system, a great part of the data processing is done during the delay and integrating time of digital voltmeter. Applying this system to the measurement of standard cells, a precision of the order of 0.1 ¿V has been obtained.
  • Keywords
    Automatic control; Computerized monitoring; Control systems; Delay effects; Laboratories; Measurement standards; Microcomputers; Programming profession; Standards development; Voltmeters;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/TIM.1972.4314049
  • Filename
    4314049