• DocumentCode
    1195225
  • Title

    Multistep field plates for high-voltage planar p-n junctions

  • Author

    Feiler, Wolfgang ; Falck, Elmar ; Gerlach, Willi

  • Author_Institution
    Tech. Univ., Berlin, Germany
  • Volume
    39
  • Issue
    6
  • fYear
    1992
  • fDate
    6/1/1992 12:00:00 AM
  • Firstpage
    1514
  • Lastpage
    1520
  • Abstract
    Multistep field plates are often used to improve the blocking capability of planar p-n junctions. The electric field at the semiconductor surface below the field plate peaks, however, at every edge of the dielectric. In order to achieve the highest possible breakdown voltage at a given number of steps in the dielectric, their heights have to be adjusted as to equalize the corresponding peak fields. For this purpose, an analytical model has been developed, which relates the peak field to the geometrical and physical parameters of the structure. From this, a systematic method has been derived for designing multistep field plates with equal peak fields at the steps. By applying this method to a planar p-n junction the blocking capability was increased from 23% without field plates to more than 89% of the bulk breakdown voltage
  • Keywords
    impact ionisation; p-n homojunctions; power electronics; semiconductor device models; HV planar p-n junctions; analytical model; blocking capability; breakdown voltage; multistep field plates; peak field; reverse biased p+-n junction; surface electric field; Analytical models; Breakdown voltage; Dielectrics; Doping; Electric breakdown; Electrostatics; P-n junctions; Varactors;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.137334
  • Filename
    137334