• DocumentCode
    1198860
  • Title

    Transient fault-tolerance through algorithms

  • Author

    Saha, Goutam Kumar

  • Volume
    25
  • Issue
    5
  • fYear
    2006
  • Firstpage
    25
  • Lastpage
    30
  • Abstract
    This article describes that single-version enhanced processing logic or algorithms can be very effective in gaining dependable computing through hardware transient fault tolerance (FT) in an application system. Transients often cause soft errors in a processing system resulting in mission failure. Errors in program flow, instruction codes, and application data are often caused by electrical fast transients. However, firmware and software fixes can have an important role in designing an ESD, or EMP-resistant system and are more cost effective than hardware. This technique is useful for detecting and recovering transient hardware faults or random bit errors in memory while an application is in execution. The proposed single-version software fix is a practical, useful, and economic tool for both offline and online memory scrubbing of an application system without using conventional N versions of software (NVS) and hardware redundancy in an application like a frequency measurement system
  • Keywords
    electrical engineering computing; electromagnetic pulse; electrostatic discharge; fault tolerant computing; firmware; transient analysis; EMP-resistant system; ESD; application system; economic tool; electrical fast transient; firmware; instruction code; mission failure; offline-online memory scrubbing; program flow; single-version enhanced processing; transient fault tolerance computing; Application software; Costs; Electrical fault detection; Electrostatic discharge; Fault tolerance; Fault tolerant systems; Hardware; Logic; Microprogramming; Software tools;
  • fLanguage
    English
  • Journal_Title
    Potentials, IEEE
  • Publisher
    ieee
  • ISSN
    0278-6648
  • Type

    jour

  • DOI
    10.1109/MP.2006.1692282
  • Filename
    1692282