• DocumentCode
    1201071
  • Title

    An International Direct Comparison of Two Josephson-Effect Voltage Standards

  • Author

    Hartland, Anthony ; Witt, Thomas J. ; Reymann, Dominique ; Finnegan, Thomas F.

  • Volume
    27
  • Issue
    4
  • fYear
    1978
  • Firstpage
    470
  • Lastpage
    474
  • Abstract
    A direct comparison of the Bureau International des Poids et Mesures (BIPM) and the National Physical Laboratory (NPL) Josephson-effect voltage standards has been accomplished by transporting the BIPM apparatus to the NPL during April 1978. The voltage of a saturated standard cell as measured by the BIPM system, V(BIPM), was found to differ from that measured by the NPL system, V(NPL), such that [V(BIPM) - V(NPL)]/V(BIPM) = 7 ± 2 × 10-8. This difference is 1.6 times the total expected one-standard deviation uncertainty for the combined systems. Direct comparison of the two 2e/h systems without an intermediate standard cell was also accomplished and is reported for the first time.
  • Keywords
    Detectors; Electromagnetic measurements; Frequency; Josephson junctions; Laboratories; Lead compounds; Measurement standards; Particle measurements; Transistors; Voltage measurement;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/TIM.1978.4314742
  • Filename
    4314742