DocumentCode
1202750
Title
Stability in High-Frequency Oscillators
Author
Heising, R.A.
Author_Institution
Bell Telephone Laboratories, Inc., New York, N.Y.
Volume
31
Issue
11
fYear
1943
Firstpage
595
Lastpage
600
Abstract
This paper discusses frequency stability with change in plate voltage of high-frequency oscillators of around 100 megacycles and shows both theoretically and experimentally that the highest stability found by many is only the result of fortuitous circuit adjustment that may readily lead to the desired result in this frequency range. It is shown that the factor next in importance in producing frequency stability is a low ratio of inductance to capacitance in the frequency-determining circuit. It is also shown that a high Q contributes little directly to stability. A high Q is necessary with low L/C ratios to get oscillations but an improvement in Q alone may give poorer stability. To get the fullest measure of stability with low L/C and high Q calls for slight adjustments in the circuit and possibly the provision of loose coupling to the frequency-determining circuit.
Keywords
Capacitance; Circuit stability; Coupling circuits; Crystals; Frequency measurement; Inductance; Q measurement; Stability criteria; Telephony; Voltage-controlled oscillators;
fLanguage
English
Journal_Title
Proceedings of the IRE
Publisher
ieee
ISSN
0096-8390
Type
jour
DOI
10.1109/JRPROC.1943.233354
Filename
1694610
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