DocumentCode
1204609
Title
The magnetic-resonance force microscope: a new tool for high-resolution, 3-D, subsurface scanned probe imaging
Author
Hammel, P. Chris ; Pelekhov, Denis V. ; Wigen, Philip E. ; Gosnell, Timothy R. ; Midzor, Melissa M. ; Roukes, Michael L.
Author_Institution
Dept. of Phys., Ohio State Univ., Columbus, OH, USA
Volume
91
Issue
5
fYear
2003
fDate
5/1/2003 12:00:00 AM
Firstpage
789
Lastpage
798
Abstract
The magnetic-resonance force microscope (MRFM) is a novel scanned probe instrument which combines the three-dimensional (3-D) imaging capabilities of magnetic-resonance imaging with the high sensitivity and resolution of atomic-force microscopy. It will enable nondestructive, chemical-specific, high-resolution microscopic studies and imaging of subsurface properties of a broad range of materials. The MRFM has demonstrated its utility for study of microscopic ferromagnets, and it will enable microscopic understanding of the nonequilibrium spin polarization resulting from spin injection. Microscopic MRFM studies will provide unprecedented insight into the physics of magnetic and spin-based materials. We will describe the principles and the state-of-the-art in magnetic-resonance force microscopy, discuss existing cryogenic MRFM instruments incorporating high-Q, single-crystal microresonators with integral submicrometer probe magnets, and indicate future directions for enhancing MRFM instrument capabilities.
Keywords
cryogenics; deconvolution; magnetic resonance; micromechanical resonators; microscopes; scanning probe microscopy; 3D imaging capabilities; chemical-specific microscopic studies; cryogenic MRFM instruments; high resolution; high sensitivity; high-Q single-crystal microresonators; integral submicrometer probe magnets; magnetic-resonance force microscope; microscopic ferromagnets; nondestructive microscopic studies; nonequilibrium spin polarization; scanned probe instrument; spin electronics; spin injection; spintronics; subsurface properties; three-dimensional imaging; Atomic force microscopy; Chemicals; High-resolution imaging; Image resolution; Instruments; Magnetic force microscopy; Magnetic materials; Polarization; Probes; Spin polarized transport;
fLanguage
English
Journal_Title
Proceedings of the IEEE
Publisher
ieee
ISSN
0018-9219
Type
jour
DOI
10.1109/JPROC.2003.811797
Filename
1200130
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