• DocumentCode
    1205509
  • Title

    Electromagnetic behaviour of bulk textured YBaCuO

  • Author

    Winter, V. ; Hermann, P.F. ; Agnoux, C. ; Leriche, A. ; Mautref, M. ; Grivon, F. ; Fevier, A. ; de Rango, P.

  • Author_Institution
    Alcatel Alsthom Recherche, Marcoussis, France
  • Volume
    28
  • Issue
    1
  • fYear
    1992
  • fDate
    1/1/1992 12:00:00 AM
  • Firstpage
    892
  • Lastpage
    895
  • Abstract
    Electrical and magnetic results obtained on bulk YBaCuO samples manufactured by the melt textured growth process are reported. These studies are important for understanding the limitation mechanisms of transport current. Transport critical current densities in excess of 2.5×108 A/m2 have been measured in a field of 2 T at 77 K in oriented YBaCuO. The critical state concept for the calculation of internal flux profiles is used to model the magnetization behavior of textured materials. Magnetization measurements are compared with theoretical curves for different orientations of the magnetic field with respect to crystallographic axes. This study makes it possible to determine inductive critical current densities which are strongly influenced by the current path geometry. The results are compared to transport Jct values. Self-field loss values are also presented
  • Keywords
    barium compounds; critical current density (superconductivity); high-temperature superconductors; losses; magnetisation; texture; yttrium compounds; bulk textured YBaCuO; critical current densities; critical state concept; current path geometry; high temperature superconductor; internal flux profiles; magnetization behavior; melt textured growth; self field loss; transport current limitation mechanisms; Critical current density; Crystalline materials; Current measurement; Density measurement; Magnetic field measurement; Magnetic flux; Magnetic materials; Magnetization; Manufacturing processes; Yttrium barium copper oxide;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.120022
  • Filename
    120022