• DocumentCode
    1207042
  • Title

    A 10-b 120-Msample/s time-interleaved analog-to-digital converter with digital background calibration

  • Author

    Jamal, Shafiq M. ; Fu, Daihong ; Chang, Nick C -J ; Hurst, Paul J. ; Lewis, Stephen H.

  • Author_Institution
    California Univ., Davis, CA, USA
  • Volume
    37
  • Issue
    12
  • fYear
    2002
  • fDate
    12/1/2002 12:00:00 AM
  • Firstpage
    1618
  • Lastpage
    1627
  • Abstract
    Digital calibration using adaptive signal processing corrects for offset mismatch, gain mismatch, and sample-time error between time-interleaved channels in a 10-b 120-Msample/s pipelined analog-to-digital converter (ADC). Offset mismatch between channels is overcome with a random chopper-based offset calibration. Gain mismatch and sample-time error are overcome with correlation-based algorithms, which drive the correlation between a signal and its chopped image or its chopped and delayed image to zero. Test results show that, with a 0.99-MHz sinusoidal input, the ADC achieves a peak signal-to-noise-and-distortion ratio (SNDR) of 56.8 dB, a peak integral nonlinearity of 0.88 least significant bit (LSB), and a peak differential nonlinearity of 0.44 LSB. For a 39.9-MHz sinusoidal input, the ADC achieves a peak SNDR of 50.2 dB. The active area is 5.2 mm2, and the power dissipation is 234 mW from a 3.3-V supply.
  • Keywords
    CMOS integrated circuits; adaptive signal processing; analogue-digital conversion; calibration; correlation methods; low-power electronics; pipeline processing; 0.99 MHz; 10 bit; 234 mW; 3.3 V; 39.9 MHz; SNDR; adaptive signal processing; correlation-based algorithms; delayed image; digital background calibration; gain mismatch; least significant bit; offset mismatch; peak differential nonlinearity; peak integral nonlinearity; peak signal-to-noise-and-distortion ratio; pipelined analog-to-digital converter; power dissipation; random chopper-based offset calibration; sample-time error; time-interleaved analog-to-digital converter; time-interleaved channels; Adaptive signal processing; Analog-digital conversion; Apertures; Calibration; Delay; Error correction; Signal processing; Signal processing algorithms; Signal sampling; Testing;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.2002.804327
  • Filename
    1088088