DocumentCode
1208530
Title
IPM synchronous machine drive response to symmetrical and asymmetrical short circuit faults
Author
Welchko, Brian A. ; Jahns, Thomas M. ; Soong, Wen L. ; Nagashima, James M.
Author_Institution
Dept. of Electr. & Comput. Eng., Univ. of Wisconsin-Madison, Madison, WI, USA
Volume
18
Issue
2
fYear
2003
fDate
6/1/2003 12:00:00 AM
Firstpage
291
Lastpage
298
Abstract
A closed-form solution is presented for the steady-state response of interior permanent magnet (IPM) synchronous machines to symmetrical short circuits including the effects of q-axis magnetic saturation. Machine response to single-phase asymmetrical short circuits is also investigated. Experimental data are presented to verify predicted behavior for both types of short circuits. It is shown that single-phase asymmetrical short circuit faults produce more severe fault responses with high pulsating torque and a significant threat of rotor demagnetization. A control strategy that purposely transitions such faults into symmetrical three-phase short circuits can minimize the fault severity and associated demagnetization risks. Implications for the design of IPM machines with improved fault tolerance are discussed.
Keywords
demagnetisation; fault tolerance; permanent magnet motors; rotors; short-circuit currents; synchronous motor drives; torque; asymmetrical short circuit faults; closed-form solution; control strategy; demagnetization risks; fault severity minimisation; high pulsating torque; improved fault tolerance; interior permanent magnet synchronous machines; q-axis magnetic saturation; rotor demagnetization; single-phase asymmetrical short circuits; steady-state response; symmetrical short circuit faults; symmetrical three-phase short circuits; synchronous motor drives; Circuit faults; Closed-form solution; Demagnetization; Fault tolerance; Magnetic circuits; Permanent magnets; Saturation magnetization; Steady-state; Synchronous machines; Torque;
fLanguage
English
Journal_Title
Energy Conversion, IEEE Transactions on
Publisher
ieee
ISSN
0885-8969
Type
jour
DOI
10.1109/TEC.2003.811746
Filename
1201102
Link To Document