• DocumentCode
    1208681
  • Title

    Realization of multiple valued logic and memory by hybrid SETMOS architecture

  • Author

    Mahapatra, Santanu ; Ionescu, Adrian Mihai

  • Author_Institution
    Electron. Lab., Inst. of Microelectron. & Microsyst., Lausanne, Switzerland
  • Volume
    4
  • Issue
    6
  • fYear
    2005
  • Firstpage
    705
  • Lastpage
    714
  • Abstract
    A novel complimentary metal-oxide-semiconductor (CMOS) single-electron transistor (SET) hybrid architecture, named SETMOS, is proposed, which offers Coulomb blockade oscillations and quasi-periodic negative differential resistance effects at much higher current level than the traditional SETs. The Coulomb blockade oscillation characteristics are exploited to realize the multiple valued (MV) literal gate and the periodic negative differential resistance behavior is utilized to implement capacitor-less multiple valued static random access memory (MV SRAM) cell. The SETMOS literal gate is then used to build up other MV logic building blocks, e.g., transmission gate, binary to MV logic encoder, and MV to binary logic decoder. Analytical SET model simulations are employed to verify the functionalities of the proposed MV logic and memory cells for quaternary logic systems. SETMOS MV architectures are found to be much faster and less temperature-sensitive than previously reported hybrid CMOS-SET based MV circuits.
  • Keywords
    CMOS logic circuits; Coulomb blockade; circuit simulation; logic gates; memory architecture; multivalued logic circuits; random-access storage; single electron transistors; Coulomb blockade oscillations; MV logic building blocks; MV logic encoder; SET model simulations; analog hardware description language; capacitor-less multiple valued static random access memory; circuit simulation; compact modeling; hybrid CMOS-SET based MV circuits; hybrid SETMOS architecture; memory cells; metal-oxide-semiconductor; multiple valued literal gate; multiple valued logic; multiple valued logic memory; multiple valued memory; periodic negative differential resistance behavior; quasiperiodic negative differential resistance effects; quaternary logic systems; single-electron transistor; transmission gate; Analytical models; CMOS technology; Circuit simulation; Dielectrics; Laboratories; MOSFET circuits; Microelectronics; Multivalued logic; Single electron transistors; Wire; Analog hardware description language; circuit simulation; compact modeling; multiple valued logic; multiple valued memory; single-electron transistors (SETS);
  • fLanguage
    English
  • Journal_Title
    Nanotechnology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1536-125X
  • Type

    jour

  • DOI
    10.1109/TNANO.2005.858602
  • Filename
    1528475