DocumentCode
1208688
Title
Assessment of high-frequency performance potential of carbon nanotube transistors
Author
Guo, Jing ; Hasan, Sayed ; Javey, Ali ; Bosman, Gijs ; Lundstrom, Mark
Author_Institution
Dept. of Electr. & Comput. Eng., Univ. of Florida, Gainesville, FL, USA
Volume
4
Issue
6
fYear
2005
Firstpage
715
Lastpage
721
Abstract
Self-consistent quantum simulations are used to explore the high-frequency performance potential of carbon nantube field-effect transistors (CNTFETs). The cutoff frequency expected for a recently reported CNT Schottky-barrier FET is well below the performance limit, due to the large parasitic capacitance between electrodes. We show that using an array of parallel nanotubes as the transistor channel reduces parasitic capacitance per tube. Increasing tube density gives a large improvement of high-frequency performance when tubes are widely spaced and parasitic capacitance dominates but only a small improvement when the tube spacing is small and intrinsic gate capacitance dominates. Alternatively, using quasi-one-dimensional nanowires as source and drain contacts should significantly reduce parasitic capacitance and improve high-frequency performance. Ballistic CNTFETs should outperform ballistic Si MOSFETs in terms of the high-frequency performance limit because of their larger band-structure-limited velocity.
Keywords
SCF calculations; Schottky barriers; capacitance; carbon nanotubes; field effect transistors; high-frequency effects; quantum theory; C; CNT Schottky-barrier FET; ballistic CNTFETs; band-structure-limited velocity; carbon nanotube field-effect transistor potentials; cutoff frequency; drain contacts; electrodes; high-frequency effects; intrinsic gate capacitance; parasitic capacitance; quasi 1D nanowires; self-consistent quantum simulations; transistor channels; tube density; CNTFETs; Carbon nanotubes; Current measurement; Cutoff frequency; Electrodes; FETs; MOSFETs; Nanowires; Parasitic capacitance; Radio frequency; Carbon nanotubes (CNTs); field-effect transistors (FETs); radio frequency (RF);
fLanguage
English
Journal_Title
Nanotechnology, IEEE Transactions on
Publisher
ieee
ISSN
1536-125X
Type
jour
DOI
10.1109/TNANO.2005.858601
Filename
1528476
Link To Document