• DocumentCode
    1208688
  • Title

    Assessment of high-frequency performance potential of carbon nanotube transistors

  • Author

    Guo, Jing ; Hasan, Sayed ; Javey, Ali ; Bosman, Gijs ; Lundstrom, Mark

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of Florida, Gainesville, FL, USA
  • Volume
    4
  • Issue
    6
  • fYear
    2005
  • Firstpage
    715
  • Lastpage
    721
  • Abstract
    Self-consistent quantum simulations are used to explore the high-frequency performance potential of carbon nantube field-effect transistors (CNTFETs). The cutoff frequency expected for a recently reported CNT Schottky-barrier FET is well below the performance limit, due to the large parasitic capacitance between electrodes. We show that using an array of parallel nanotubes as the transistor channel reduces parasitic capacitance per tube. Increasing tube density gives a large improvement of high-frequency performance when tubes are widely spaced and parasitic capacitance dominates but only a small improvement when the tube spacing is small and intrinsic gate capacitance dominates. Alternatively, using quasi-one-dimensional nanowires as source and drain contacts should significantly reduce parasitic capacitance and improve high-frequency performance. Ballistic CNTFETs should outperform ballistic Si MOSFETs in terms of the high-frequency performance limit because of their larger band-structure-limited velocity.
  • Keywords
    SCF calculations; Schottky barriers; capacitance; carbon nanotubes; field effect transistors; high-frequency effects; quantum theory; C; CNT Schottky-barrier FET; ballistic CNTFETs; band-structure-limited velocity; carbon nanotube field-effect transistor potentials; cutoff frequency; drain contacts; electrodes; high-frequency effects; intrinsic gate capacitance; parasitic capacitance; quasi 1D nanowires; self-consistent quantum simulations; transistor channels; tube density; CNTFETs; Carbon nanotubes; Current measurement; Cutoff frequency; Electrodes; FETs; MOSFETs; Nanowires; Parasitic capacitance; Radio frequency; Carbon nanotubes (CNTs); field-effect transistors (FETs); radio frequency (RF);
  • fLanguage
    English
  • Journal_Title
    Nanotechnology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1536-125X
  • Type

    jour

  • DOI
    10.1109/TNANO.2005.858601
  • Filename
    1528476