Second-generation PCB self-learn

Manufacturing defect analysers generally incorporate some form of self-learn capability, allowing board tests to be developed in as short a time as possible without the need for skilled programmers. Existing methods generally meet these two objectives but lack both fault coverage and component level diagnostics. Following a brief introduction to the use of manufacturing defect analysers, this paper describes a new self-learn technique which allows a board test to be generated incorporating individual tests on each component. This provides diagnostics close to those of manually developed programs.