• DocumentCode
    1212047
  • Title

    Mach–Zehnder Interferometer for Real-Time In Situ Monitoring of Refractive Microlens Characteristics at the Fabrication Level

  • Author

    Gomez, Virginia ; Ottevaere, Heidi ; Thienpont, Hugo

  • Author_Institution
    Vrije Univ. Brussel, Brussels
  • Volume
    20
  • Issue
    9
  • fYear
    2008
  • fDate
    5/1/2008 12:00:00 AM
  • Firstpage
    748
  • Lastpage
    750
  • Abstract
    We present a Mach-Zehnder interferometer to monitor in situ and in real-time the geometrical and optical characteristics of refractive microlenses during their fabrication process to increase the fabrication accuracy as well as the sample-to-sample reproducibility. We demonstrate for one test case that the deviation of our developed interferometric system against commercial instrumentation is smaller than 5 % while its repeatability error is smaller than 1.5% after calibration against dedicated off-line instrumentation. To conclude, we demonstrate the practical usefulness of this interferometer by applying it to the fabrication of microlenses by deep proton writing.
  • Keywords
    Mach-Zehnder interferometers; microlenses; Mach-Zehnder interferometer; deep proton writing; fabrication level; real-time in situ monitoring; refractive microlens characteristic; Geometrical optics; Instruments; Lenses; Microoptics; Monitoring; Optical device fabrication; Optical interferometry; Optical refraction; Reproducibility of results; System testing; Characterization; deep proton writing (DPW); interferometry; microlenses; real-time in situ monitoring;
  • fLanguage
    English
  • Journal_Title
    Photonics Technology Letters, IEEE
  • Publisher
    ieee
  • ISSN
    1041-1135
  • Type

    jour

  • DOI
    10.1109/LPT.2008.921089
  • Filename
    4512099