DocumentCode
1212230
Title
Two ions in one trap: ultra-high precision mass spectrometry?
Author
Rainville, Simon ; Thompson, James K. ; Pritchard, David E.
Author_Institution
Dept. of Phys., Massachusetts Inst. of Technol., Cambridge, MA, USA
Volume
52
Issue
2
fYear
2003
fDate
4/1/2003 12:00:00 AM
Firstpage
292
Lastpage
296
Abstract
By trapping two different ions in the same Penning trap at the same time, we simultaneously measured the ratio of their cyclotron frequencies (from which we obtain their atomic mass ratio) with a precision of about 10-11 in only a few hours. In order to perform these comparisons, we must be able to measure and control all three normal modes of motion of each ion - cyclotron, axial, and magnetron. We have developed novel techniques to do, so and we are currently using these tools to carefully investigate the important question of systematic errors in those measurements. This new technique shows promise to expand the precision of mass spectrometry an order of magnitude beyond the current state-of-the-art.
Keywords
mass spectroscopy; particle traps; trapped ions; Penning trap; atomic mass ratio; cyclotron frequencies; ion trapping; ultra-high precision mass spectrometry; Atomic measurements; Current measurement; Cyclotrons; Energy measurement; Frequency measurement; Magnetic field measurement; Mass spectroscopy; Metrology; Performance evaluation; Physics;
fLanguage
English
Journal_Title
Instrumentation and Measurement, IEEE Transactions on
Publisher
ieee
ISSN
0018-9456
Type
jour
DOI
10.1109/TIM.2003.810725
Filename
1202032
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