• DocumentCode
    1212230
  • Title

    Two ions in one trap: ultra-high precision mass spectrometry?

  • Author

    Rainville, Simon ; Thompson, James K. ; Pritchard, David E.

  • Author_Institution
    Dept. of Phys., Massachusetts Inst. of Technol., Cambridge, MA, USA
  • Volume
    52
  • Issue
    2
  • fYear
    2003
  • fDate
    4/1/2003 12:00:00 AM
  • Firstpage
    292
  • Lastpage
    296
  • Abstract
    By trapping two different ions in the same Penning trap at the same time, we simultaneously measured the ratio of their cyclotron frequencies (from which we obtain their atomic mass ratio) with a precision of about 10-11 in only a few hours. In order to perform these comparisons, we must be able to measure and control all three normal modes of motion of each ion - cyclotron, axial, and magnetron. We have developed novel techniques to do, so and we are currently using these tools to carefully investigate the important question of systematic errors in those measurements. This new technique shows promise to expand the precision of mass spectrometry an order of magnitude beyond the current state-of-the-art.
  • Keywords
    mass spectroscopy; particle traps; trapped ions; Penning trap; atomic mass ratio; cyclotron frequencies; ion trapping; ultra-high precision mass spectrometry; Atomic measurements; Current measurement; Cyclotrons; Energy measurement; Frequency measurement; Magnetic field measurement; Mass spectroscopy; Metrology; Performance evaluation; Physics;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/TIM.2003.810725
  • Filename
    1202032