Extension of the IEN traceability for AC voltages below 200 mV

Author

Pogliano, Umberto ; Bosco, Gian Carlo ; D´Elia, Vincenzo

Author_Institution

Inst. Elettrotecnico Nazionale Galileo Ferraris, Turin, Italy

Volume

52

Issue

2

fYear

2003

fDate

4/1/2003 12:00:00 AM

Firstpage

375

Lastpage

379

Abstract

This paper describes the system, the standards, and the procedures developed at the Istituto Elettrotecnico Nazionale Galileo Ferraris for the extension of traceability to low voltage ranges down to 1 mV. Specific new features are the technique for the generation of low voltage, the procedures for building the traceability down to 1 mV, and the method for the evaluation of the load correction based on perturbations with known admittances.

Keywords

calibration; electric admittance; error correction; transfer standards; voltage measurement; voltmeters; 200 to 1 mV; AC voltage; AC-DC thermal converter; IEN traceability extension; Istituto Elettroteenico Nazionale Galileo Ferraris; load admittances; load correction; low voltage generation; low voltage range extension; measurement standards; perturbations; voltmeters; Calibration; Electric variables measurement; Instruments; Low voltage; Measurement standards; Standards development; System testing; Thermal resistance; Thermal variables measurement; Voltmeters;

fLanguage

English

Journal_Title

Instrumentation and Measurement, IEEE Transactions on

Publisher

ieee

ISSN

0018-9456

Type

jour

DOI

10.1109/TIM.2003.810458

Filename

1202051