• DocumentCode
    1212530
  • Title

    Numerical and Experimental Parameter Study of Helix Layers

  • Author

    Meiners, Christian ; Jacob, Arne F.

  • Author_Institution
    Inst. fur Hochfrequenztech., Tech. Univ. Hamburg-Harburg, Hamburg
  • Volume
    56
  • Issue
    5
  • fYear
    2008
  • fDate
    5/1/2008 12:00:00 AM
  • Firstpage
    1321
  • Lastpage
    1328
  • Abstract
    The focus of this contribution is on the scattering of small metal helices in layered arrangements that are located in free space or backed with a perfect electric conductor. Thereby, the -parameters obtained by means of a scattering approach based on the dipole-polarizabilities of the helices serve as a reference for the studies. The method accounts for the discrete particle positions. However, for practical reasons some averaging is involved. An analysis of fabricated inclusions appears to be essential for a comparison of the utilized method with measurements of material samples. Good agreement is confirmed by varying the thickness of the layer as well as the density of the inclusions. Further, the applicability of the Clausius-Mossotti mixing rule to the presented setups is critically assessed by comparison. In principle, it turns out that the scattering derived via classical effective material parameters differs from the one of the actual layers. Nevertheless, mixing rules could still be a method of choice if mutual coupling were not as strong as in the cases considered here.
  • Keywords
    chirality; electromagnetic wave scattering; chiral media; discrete particle positions; helix layers; nonhomogeneous media; Electromagnetic scattering; Jacobian matrices; Mutual coupling; Nonhomogeneous media; Optical films; Optical resonators; Optical scattering; Particle scattering; Resonance; Scattering parameters; Chiral media; electromagnetic scattering; helices; nonhomogeneous media; scattering parameters measurement;
  • fLanguage
    English
  • Journal_Title
    Antennas and Propagation, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-926X
  • Type

    jour

  • DOI
    10.1109/TAP.2008.922170
  • Filename
    4512153